300+ Connector SKUs.Zero Real Defects Collected.

A high-mix connector manufacturer needed scratch and dent inspection across hundreds of SKUs. Damaging real parts to build a training set is destructive, slow, and expensive. The OV Auto-Defect Creator Studio synthesized the defects per SKU, on real reference images, with zero physical parts harmed.

300+
Active SKUs in the Catalog
2
Defect Classes Per SKU (Scratch, Dent)
0
Real Parts Damaged
92.7%
Live HMI Yield

The Problem

Hundreds of SKUs is the reality, not the exception.

A modern connector line runs hundreds of active SKUs through the same production cells: SFP cages, pin-matrix headers, multi-cavity housings, bracket assemblies, hex-pattern cages, four-row card cages. Each variant has its own geometry, its own surface, its own ways of failing.

Classical computer vision says: collect real defect samples per SKU, label them, train a model. That answer does not survive contact with reality. Real defect samples either do not exist yet (the SKU is new), or accumulate too slowly (most defects are too rare to gather in volume), or are too expensive to manufacture deliberately (production-grade housings cost real money to damage on purpose).

The studio swaps that bottleneck. Synthetic defects are authored on real reference images per SKU. The training data exists by the end of the shift. The training data covers every SKU on the line.

In The Studio

Prompt the defect. The SKU never gets damaged.

A reference image of the connector is loaded into the OV Auto-Defect Creator Studio. The operator selects the area where the defect should appear and picks Scratch from the AI-suggested defect classes. The studio handles the rest, rendering a photorealistic synthetic defect anchored to the real connector surface.

OV Auto-Defect Creator Studio · Scratch on Pin-Array Connector
OV Auto-Defect Creator Studio with a region drawn on a pin-array connector and the Scratch class selected

Scratch · Across SKUs

Same defect class, every connector variant.

A representative slice of the scratch dataset, generated across nine distinct connector SKUs. The synthetic defects respect the geometry and lighting of each real reference image. Every sample carries its pixel-level segmentation mask.

Dent · Across SKUs

Second defect class. Same studio, same workflow.

A representative slice of the dent dataset across ten more SKUs. Each one a different geometry, each one authored in seconds from the SKU's own reference image. No two connectors share a training assumption.

Why This Works

Capabilities on Display

Four properties of synthetic-data inspection that make high-SKU connector lines actually trainable.

No Real Parts Damaged

Generating real scratches and dents on production hardware to build a dataset is destructive, slow, and expensive. The studio damages zero physical parts and produces the same training value.

Per-SKU Coverage at Scale

Each connector SKU gets its own synthetic defect samples authored on its own reference image. No shared assumptions, no cross-contamination between SKU classes.

New SKUs Onboard in Hours

When the OEM specifies a new variant, defect samples for that SKU exist by the end of the same shift. No multi-week data collection effort holds up the changeover.

Production-Ready Output

The trained recipe runs on the OV20i as Scrub Detection, with full HMI statistics: total inspections, pass/fail, yield percentage, and alignment confidence.

Live On The Line

Scrub Detection. 92.7% yield. Real connectors.

The trained recipe hot-swapped into the OV20i HMI as the Scrub Detection profile. The live screen shows the production line catching real defects across 227,639 inspections with 99.5% alignment confidence. The training data was synthetic. The defects it catches are real.

OV20i HMI running Scrub Detection live on a connector production line at 92.7% yield

Cover Every SKU on Your Line, Without Breaking a Single Part

Send us reference images of the SKUs you care about. We return synthetic defect samples per SKU, ready to train, ready to ship to your inspection station.